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Article: RF production probe card. (Test Equipment).
- Article from:
- Microwave Journal
- Article date:
- June 1, 2003
CopyrightCOPYRIGHT 2003 Horizon House Publications, Inc. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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The Pyramid[TM] Probe Card is a RF multi-device test production probe card. The probe card allows wafer testing of multiple RF semiconductor wafers in production simultaneously. It has proved effective in applications such as WLAN Blue Tooth[TM] and cellular/PC S devices. The Pyramid Probe card increases ...