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Article: Novel sensors illuminate minute circuit defects. (Microscopy).(magnetic-sensing microscope)(Brief Article)
- Article from:
- R & D
- Article date:
- June 1, 2003
CopyrightCOPYRIGHT 2003 Advantage Business Media. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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While the advent of micro/nano technology has allowed for quantum leaps in a variety of fields, the ability to accurately survey devices at sub-microscopic levels has remained a challenge. Indeed, "looking" for hairline defects in fiber optic cable, in nanostructures and the circuit board, has presented a difficulty to researchers and the overall quality analysis process.
A team of researchers from Brown Univ., Providence, R.I., have addressed that need and developed a new magnetic-sensing microscope, which will allow researchers to monitor the current flow through the smallest components at a resolution 1,000 times greater than existing technology. Along with ...