|
|
Article: AFM in surface finishing: part III lateral force microscopy and friction measurements.(Technology Update; atomic force microscopy )
- Article from:
- Finishing
- Article date:
- September 1, 2003
- Author:
CopyrightCOPYRIGHT 2003 Turret West Ltd. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
|
Introduction
This paper is the third in a series of practical topics on the use of atomic force microscopy (AFM) in surface finishing (1,2) and focuses on lateral force microscopy (LFM) (3) as a method for obtaining frictional, or tribological, data. This AFM technique monitors the lateral twisting of the cantilever as it is rastered over the sample's surface (3). The resulting image, which can be obtained simultaneously with the topography (height) image, shows contrast between areas with differing frictional properties. LFM has been applied to the study of a wide range of systems, including: single crystals (40, alkanethiols on golds (5), silanes on glass (6), ...