|
|
Article: Atom probe analysis: the atom probe microscope provides three-dimensional compositional and structural analysis at the atomic- and near-atomic scales.
- Article from:
- Advanced Materials & Processes
- Article date:
- February 1, 2004
- Author:
CopyrightCOPYRIGHT 2004 ASM International. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
|
When introducing the atom probe microscope, it is important to first address a common misconception that the atom probe microscope is related to the more widely known atomic force microscope (AFM), which operates by scanning a sharp tip across surfaces and provides atomic-scale imaging. In contrast, the atom probe microscope operates by removing and analyzing individual atoms.
[FIGURE 1 OMITTED]
The atom probe's unique atom-by-atom analysis provides a map of the elemental and isotopic identity and position of individual atoms in volumes of material of up to 100 nm in diameter (parallel to specimen surface) and 100 nm in depth (normal to specimen ...