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Article: Reliability of gallium arsenide devices. (semiconductors) (EW Design Engineers' Handbook & Manufacturers Directory)
- Article from:
- Journal of Electronic Defense
- Article date:
- January 1, 1992
- Author:
CopyrightCOPYRIGHT 1992 Horizon House Publications, Inc. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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RELIABILITY OF GALLIUM ARSENIDE DEVICES
Reliability has been a fundamental concern of semiconductor manufacturing for many years. A semiconductor chip installed in any product is expected to perform as intended over some reasonable lifetime and under imperfect environmental conditions. Although such devices can be encapsulated or packaged to protect against many environmental conditions, they are always vulnerable to chemical and physical changes that occur within the constituent materials of the device itself. The rate at which these changes occur is often enhanced by electrical current flow and high temperature.
Changes within the device itself will ...