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Article: FormFactor's Newest Probe Card Delivers High Throughput 300 mm DRAM and Flash Memory Wafer Test.
- Article from:
- Business Wire
- Article date:
- July 14, 2004
CopyrightCOPYRIGHT 2004 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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SAN JOSE, Calif. -- FormFactor Four Touchdown Probe Card Enables Reliable High-Throughput Wafer Test, Lower Total Cost of Test for 300 mm Memory Manufacturers
FormFactor, Inc. (Nasdaq:FORM), a leading provider of advanced wafer probe cards, today announced a new high parallelism probe card, which tests 300 mm DRAM or Flash memory wafers in as few as four touchdowns. The new FormFactor PH150S(TM) wafer probe card leverages FormFactor's proprietary technologies, including its MicroSpring(R) contact and design technologies and its precision micro machining manufacturing processes, to cost-effectively expand wafer test capacity and reduce total cost of test.