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Article: Electron microscopes stand corrected: correction for the spherical aberration of lenses in electron microscopes is allowing scientists to push the resolution into the sub-angstrom range, opening the doors to new frontiers.
- Article from:
- R & D
- Article date:
- July 1, 2004
- Author:
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KEYWORDS * Electron Microscopes * Aberration Correction * Resolution
Microscopes are indispensable tools to researchers in various scientific fields, allowing them to examine the relationship of a material's properties to its structure. In these fields, the goal of microscopists is to achieve atomic scale resolution to view the arrangement of materials' building blocks.
However, the resolution of electron microscopes (EMs) has always been hampered by the spherical aberration ([C.sub.s]) of the lenses, which both focus the beam onto the specimen and the images onto the various detectors. This aberration stems from the outer areas of the objective lenses ...