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Article: New Chip Technology from STMicroelectronics Eliminates 'Soft Error' Threat To Electronic Systems; Tests confirm new technology is virtually immune to effects of earth's low-level background radiation.
- Article from:
- PR Newswire
- Article date:
- December 15, 2003
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Copyright informationCOPYRIGHT 2003 PR Newswire Association LLC. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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STMicroelectronics , one of the world's leading semiconductor manufacturers, has announced a new semiconductor technology that virtually eliminates a potential problem that has been increasingly haunting electronic equipment manufacturers in recent years: the growing vulnerability of silicon chips to so-called "soft errors".
These soft errors are caused by ever-present nuclear particles that make up the earth's low intensity background radiation. Originating from the cosmic rays from space or from tiny traces of radioactive elements that occur in all materials, the particles are not dangerous by themselves but they can potentially disrupt the operation of silicon chips and ...