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Article: Optical and x-ray inspection complement electrical test: APEX, February 22-24, Anaheim, CA, www.goapex.org.(SHOWHIGHLIGHTS)
- Article from:
- Test & Measurement World
- Article date:
- April 1, 2005
CopyrightCOPYRIGHT 2005 Reed Business Information, Inc. (US). This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Agilent Technologies' (www.agilent.com) Medalist i5000 in-circuit test (ICT) system employs new software and a new non-multiplexed tester-per-pin architecture and accelerates test and fixture development while simplifying the engineering-change-order process. The new system maintains the Asset Intertech (www.assetintertech.com) Scanworks boundary-scan support of the Agilent 3070 Series. Goepel electronic (www.goepel.com) demonstrated its next-generation Scanflex boundary-scan platform--a modular system consisting of Scanflex modular controllers with external Scanflex TAP transceivers (SFX-Transceivers) and parallel Scanflex I/O modules (SFX-Modules). Scanflex supports ...
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Article: CheckSum Announces Distribution Agreement with Atlantech.
Business Wire;
February 28, 2008 ;
634 words
... ... successful, high-speed MultiWriter ISP device programming system ... especially the innovative MultiWriter ISP programming system ... more information, visit www.checksum.com. About ... more information, visit www.atlantechusa.com ...
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