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Article: Advantest Launches High-Speed Test System Optimized to Test High-Speed, High-Picture-Quality CMOS Image Sensors.
- Article from:
- PR Newswire
- Article date:
- December 2, 2004
CopyrightCOPYRIGHT 2004 PR Newswire Association LLC. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Advantest Corporation , the global leader in semiconductor test systems, today introduced its T6171 complementary metal-oxide semiconductor (CMOS) image-sensor test system. Responding to rapidly expanding demand for CMOS image sensors used in digital cameras and camera-equipped cellular phones, Advantest has optimized the new system to conduct high-speed test of up to eight devices in parallel. The T6171 is being unveiled this week during SEMICON Japan, held December 1-3 at Makuhari Messe.
Demand for CMOS image sensors, which offer small size and low power consumption, continues to grow each year. Recent technical innovations have also opened up opportunities ...