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Design and Analysis of Accelerated Tests for Mission-Critical Reliability.(Book Review)
- Article from:
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Technometrics
- Article date:
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May 1, 2005
- Author:
- Ding, Yu
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Copyright informationCOPYRIGHT 2005 American Statistical Association. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Design and Analysis of Accelerated Tests for Mission-Critical Reliability, Michael J. LUVALLE, Bruce G. LEFEVRE, and SriRaman KANNAN, Boca Raton, FL: Chapman & Hall/CRC, 2004, ISBN 1-58488-471-1, xii + 236 pp., $99.95.
This book discusses the challenges of accelerated tests for mission-critical reliability and the solutions to those challenges. For mission-critical components, which usually use ultrahighly reliable devices, the classical accelerated test methods could be problematic. Reliability data extrapolation may not be sensible, given that very few failures or little substantial degradation can be observed and that any degradation or failure actually observed during ...