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Article: Breaking through the barrier: recent optical design advances in transmission electron microscopy have resulted in significant improvements in aberration correction and resolution.
- Article from:
- R & D
- Article date:
- July 1, 2005
- Author:
CopyrightCOPYRIGHT 2005 Advantage Business Media. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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The resolution of a transmission electron microscope (TEM) is mainly determined by the properties of the objective lens similar to that in an optical microscope. However, lenses are never perfect and exhibit a variety of defects. One defect, called spherical aberration, which is characterized by the spherical aberration coefficient, [C.sub.S], describes the effect that rays or electrons away from the optical axis are not focused into the same focal point as those propagating on the optical axis.
In light optics, improved manufacturing quality, sophisticated shapes of lens surfaces, and a combination of lenses have led to high optical properties which result in a ...