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Article: Advancing state-of-the-art imaging capabilities: electron-optical beam lines will provide opportunities for complex problems which escape the imaging capabilities of traditional electron microscopy systems.(Argonne National Laboratory)
- Article from:
- R & D
- Article date:
- July 1, 2006
- Author:
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Traditional electron microscopy (EM) is an essential component in the imaging and characterization of materials. As researchers delve more deeply into atomic scale materials and phenomena, however, changes in the imaging and characterization requirements of instrumentation increase.
Additionally, as technology increases, more demands are made to find solutions to national strategic issues, such as energy, health, and national defense. And increasingly, the best solutions for these issues are founded in atomic scale materials.
The solutions to these issues can involve:
* Establishing the energetics, kinetics, and dynamics of nanoscale phenomena ...