Article: FormFactor Unveils Harmony XP(TM) Wafer Probe Card, the Industry's First Two-Touchdown 300-mm DRAM Wafer Probe Solution.

Article: Wafer Probe Card.
Semiconductor International;  April 1, 2007 ;     354 words ...Staff The Harmony XP probe card is an advanced wafer probing solution for high-density mobile ... sizes, higher frequency and higher parallelism testing. The Harmony XP probe card can test 300 mm 1 Gb DRAM wafers in as few as two touchdowns ...

Article: Wafer probe card.(TEST & MEASUREMENT)
ECN-Electronic Component News;  March 1, 2007 ;     359 words ...FormFactor, Inc. introduced its Harmony XP probe card, an advanced wafer probing system for high-density mobile ... higher frequency and higher parallelism testing. The probe card can enable testing of 300 mm 1 GB DRAM wafers. FormFactor ...

Article: Probe Card Technology.
Semiconductor International;  March 15, 2009 ;     366 words ... ... test technology to increase probe test capacity. The wafer probe card capability enables more efficient use of tester channels on ... The solution is being offered on the company's PH150XP and Harmony XP probe cards for DRAM wafer testing. FormFactor Inc. , Livermore ...

Article: FormFactor Unveils PH150XP Probe Solution for DRAM Wafer Testing.
Business Wire;  April 11, 2007 ;     700+ words ... ... DRAM wafer testing. The PH150XP probe card offers several yield and throughput ... complements FormFactor's new Harmony XP[TM] wafer probe solution ... this past January. While the Harmony XP probe card is designed for full-area 300 ...

Article: SV Probe Introduces 2 New Probe Card ...
Business Wire;  July 8, 2008 ;     700+ words ... ... Ellipsiz Ltd, today introduced 2 new probe card products, SureTouch[TM], a one touch ... LogicTouch[TM], a fine pitch vertical probe card. Both new products aim to provide superior ... high growth memory and advanced logic probe card market segments over the next few years ...

Article: FormFactor Achieves Milestone with Adoption of Takumi(TM) ...
Business Wire;  June 5, 2007 ;     700+ words ...Proprietary Probe Card Technology Enables More Die Per Wafer ... milestone for its Takumi parametric wafer probe card, which has now been adopted by 20 ... line parametric testing. The Takumi probe card extends FormFactor's probe card technology ...

Article: SV Probe Introduces 2 New Probe Card Solutions.
China Weekly News;  July 21, 2008 ;     700+ words ... ... Ellipsiz Ltd, today introduced 2 new probe card products, SureTouch(TM), a one touch ... LogicTouch(TM), a fine pitch vertical probe card. Both new products aim to provide superior ... high growth memory and advanced logic probe card market segments over the next few years ...