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Article: CCD detection system speeds x-ray diffraction analysis. (charge-coupled device)
- Article from:
- R & D
- Article date:
- October 1, 1994
- Author:
CopyrightCOPYRIGHT 1994 Advantage Business Media. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Using a charge-coupled device (CCD) detector to obtain direct electronic imaging of x-ray diffraction patterns, the Siemens Molecular Analysis Research Tool (SMART) greatly reduces sample analysis time while substantially improving the quality of acquired data.
SMART, developed by the Analytical Instrument Div. of Siemens Industrial Automation Inc., Madison, Wis., rapidly and accurately analyzes crystalline materials, providing precise bond length and angle information, absolute configuration, and the arrangement of molecules within a crystal lattice, in addition to confirming the atomic connectivity and stereochemistry of the material. SMART was also one of this ...