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Article: EPIC ANNOUNCES ELECTROMIGRATION AND VOLTAGE DROP DETECTION BEFORE SILICON
- Article from:
- PR Newswire
- Article date:
- May 22, 1995
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Copyright informationCOPYRIGHT 1995 PR Newswire Association LLC. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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SANTA CLARA, Calif., May 22 /PRNewswire/ -- EPIC Design Technology, Inc., today announced RailMill(TM), the first commercially-available IC reliability analysis tool to detect electromigration and voltage drop problems before silicon. RailMill leverages the company's expertise in power and timing and advances EPIC into the reliability area for IC design and verification.
RailMill is ideal for complex high performance deep submicron custom, structured custom or ASIC designs. It provides unique electromigration and voltage drop analysis from simulation. RailMill accurately analyzes current and voltage behavior and indicates where local current density or voltage drop is ...