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3-D metrology system boasts high precision.
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Test & Measurement World
- Article date:
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December 1, 2007
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Copyright informationCOPYRIGHT 2007 Reed Business Information, Inc. (US). This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Staff
Designed for researchers working between the limits of conventional optical microscopes and scanning electron microscopes, the LEXT OLS3100 confocal laser scanning microscope from Olympus permits high-resolution 3-D observation and measurement in real time. The LEXT provides a horizontal resolution of 0.12 A[micro]m and a magnification range from 120X to 14,400X to meet a diverse range of needs in fine surface-profile measurement.
A 3-D image navigation tool guides users through each step of microscopic observation, and a 3-D image capture is performed with just ...
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