Article: Practical Ways to Lower Probe Costs.

Article: Probe Card Simplifies Test and Replacement.(Editorial)
Semiconductor International;  July 1, 2006 ;     681 words ......or tester-related situations; 40% is probe-card related. A company may only have five...Livermore, Calif.) has introduced its Harmony probe card, a plug-and-probe design produced with...implemented on the tester or prober, reducing probe card components and providing lower system...

Article: California Inventors Develop Vertical Probe Card
US Fed News Service, Including US State News;  October 25, 2006 ;     287 words ......Calif., have developed a vertical probe card for mounting generally perpendicular...test to reduce heat transfer to the probe card during test. According to the U.S. Patent & Trademark Office: "A probe card is vertically mounted generally...

Article: Improving the structural stability of probe cards: simple mechanical changes can significantly improve probe card performance.(IC ATE)
EE-Evaluation Engineering;  October 1, 2004 ;     700+ words ......tight tolerance. In the dual-die shelf probe card in Figure 1. a large number of connecting...the ceramic shelf and the thick FR4 PCB probe card also deflect under load. In Figure 2...Touchdown of a wafer on the dual-die shelf probe card is designed to produce 2.5-mil overtravel...

Article: Idaho Inventor Develops Probe Card Damage Preventing Apparatus
US Fed News Service, Including US State News;  October 6, 2006 ;     276 words ......developed an apparatus to prevent damage to probe card. According to the U.S. Patent & Trademark...probe elements (e.g., probe needles) of a probe card." An abstract of the invention, released...traces residing over a surface of the probe card. Methods of fabricating a ...

Article: Idaho Inventor Develops Probe Card Damage Prevention Method
US Fed News Service, Including US State News;  May 24, 2007 ;     264 words ......developed a method to prevent damage to probe card. According to the U.S. Patent & Trademark...probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses...traces residing over a surface of the probe card. Methods of fabricating a probe ...

Article: SV Probe Introduces 2 New Probe Card Solutions.
China Weekly News;  July 21, 2008 ;     690 words ......Ellipsiz Ltd, today introduced 2 new probe card products, SureTouch(TM), a one touch...LogicTouch(TM), a fine pitch vertical probe card. Both new products aim to provide superior...high growth memory and advanced logic probe card market segments over the next few years...

Article: U.S., Canadian Inventors Develop Integrated Circuit Testing Probe Card
US Fed News Service, Including US State News;  December 24, 2007 ;     317 words ......developed an integrated circuit testing probe card. According to the U.S. Patent & Trademark...testing die on a wafer are disclosed. A probe card incorporating temperature control devices...temperature throughout the thickness of the probe card is disclosed." An abstract of the ...

Article: RF production probe card. (Test Equipment).
Microwave Journal;  June 1, 2003 ;     89 words ...The Pyramid[TM] Probe Card is a RF multi-device test production probe card. The probe card allows wafer testing of multiple RF semiconductor wafers in production simultaneously. It has proved effective in applications such as WLAN Blue Tooth[TM...

Article: Oregon, California, New York Inventors Develop Full Wafer Probe Card
US Fed News Service, Including US State News;  February 2, 2007 ;     321 words ......Chappaqua, N.Y., have developed a full-wafer probe card along with related methods and systems...Patent & Trademark Office: "The probe card includes test probes comprising cantilever...dice residing on a device wafer. The probe card may be fabricated from, for example...

Article: FormFactor First to Introduce Six-Touchdown Probe Card to Test 300mm DRAM Wafers.
Canadian Corporate News;  July 17, 2002 ;     700+ words ......17, 2002 SEMICON West 2002 New PH150 Probe Card Reduces Cost of Test and Capital Equipment...cards, today introduced the PH150(TM) probe card that enables testing of 300mm dynamic...fabrication facilities (fabs). The PH150 probe card incorporates FormFactor's scalable MicroSpring...

Article: Applied Precision Announces Enhancements To PrecisionPoint VX2 Probe Card Analyzer.
PR Newswire;  July 18, 2001 ;     642 words ......upgrades to its PrecisionPoint(TM) VX2 Probe Card Analyzer. The enhancements, including...become a standard in the industry as a probe card test, rework and repair station. It has...and probe test capability (8000) of any probe card analyzer on the market, enabling efficient...

Article: FormFactor Bolsters Wire Bond Logic Probe Card Family
Wireless News;  December 9, 2007 ;     602 words ......12-09-2007 FormFactor Bolsters Wire Bond Logic Probe Card Family WIRELESS NEWS-December 9, 2007-FormFactor Bolsters Wire Bond Logic Probe Card Family (C)2007 10Meters - http://www...the latest addition to its TrueScale probe card family for wire bond system-on-chip...

Article: California Inventor Develops Probe Card Apparatus Designing Method
US Fed News Service, Including US State News;  July 25, 2008 ;     218 words ......of Danville, Calif., has developed a probe card designing method. According to the U.S. Patent & Trademark Office: "A probe card apparatus is configured to have a desired...The compliance of the probes of the probe card apparatus is determined, and an additional...

Article: Probe Card.(Fine-pitch, multi-DUT, high-frequency, high-temperature applications)(Brief Article)
Semiconductor International;  November 1, 2001 ;     57 words ......high-frequency, high-temperature and area arrays. Multi-square probe card is adapted for peripheral pad layout-type devices. Fine-pitch probe card for logic devices has a minimum pitch up to 40 [micro]m. Low-leakage probe card adapts for Agilent 4073. etc.