Article: SV Probe Introduces 2 New Probe Card Solutions.(Company overview)

Article: SV Probe Completes Acquisition of K&S Wafer Test Assets.
Business Wire;  March 7, 2006 ;     249 words ......as a result SV Probe will now be...advanced-vertical probe card products and...expected to move SV Probe into the global top 3 probe card manufacturers...base. About SV Probe SV Probe PTE Ltd, a worldwide probe card and test ...

Article: SV Probe Acquires K&S Wafer Test Assets; Combination Propels SV Probe to Global Top 3.(Company Profile)
Business Wire;  January 26, 2006 ;     628 words ......conclusion that our probe card customers...selecting SV Probe, we've found...K&S' probe card business was...sales, while SV Probe was ranked...sales. About SV Probe SV Probe PTE Ltd, a worldwide probe card and test ...

Article: Teradyne Announces Partnership with FormFactor to Drive Down DRAM Test Costs with 128 Device in Parallel Probing Solution.
Business Wire;  September 13, 2000 ;     700+ words ......develop a 128-device-under-test (DUT) DRAM probe card. Announcement of the highly parallel...said Mark Brandemuehl, Vice-President of Probe Card Marketing at FormFactor. Once again,...much as $50 million or more. A 128-DUT probe card that takes advantage of Teradyne's next...

Article: New Keithley Parametric Test Software Minimizes Operator Error and Speeds Up Production.
Business Wire;  April 18, 2001 ;     700+ words ......KTE), Keithley Recipe Manager (KRM) and Probe Card Manager (PRM) will elevate production...as selecting the wrong test program or probe card, and provide absolute historical correlation...under test to the correct recipe and probe card. Such errors can be very costly due to...

Article: FormFactor, Inc. Ships the World's First Production 64-Device In-Parallel Dram Probe Card; Technology Pioneer Advances the State of the Art in High Parallelism Probing.
Business Wire;  July 7, 1999 ;     700+ words ......production 64 device-under-test (DUT) probe card for production wafer probing of...megabit synchronous DRAMs. The 64-DUT probe card reduces the time required to test...depreciation. FormFactor's new 64-DUT probe card solution is a straightforward extension...

Article: FormFactor Unveils PH150XP Probe Solution for DRAM Wafer Testing.
Business Wire;  April 11, 2007 ;     700+ words ......the introduction of its PH150XP wafer probe card, an extension of the company's benchmark...family for DRAM wafer testing. The PH150XP probe card offers several yield and throughput enhancements...this past January. While the Harmony XP probe card is designed for full-area 300-mm ...

Article: FormFactor Achieves Milestone with Adoption of Takumi(TM) Parametric Probe Card by 20 Leading IC Manufacturers.
Business Wire;  June 5, 2007 ;     700+ words ...Proprietary Probe Card Technology Enables More Die Per Wafer...milestone for its Takumi parametric wafer probe card, which has now been adopted by 20 leading...end-of-line parametric testing. The Takumi probe card extends FormFactor's probe card technology...

Article: FormFactor First to Introduce Six-Touchdown Probe Card to Test 300mm DRAM Wafers.
Business Wire;  July 17, 2002 ;     680 words ......High-Tech Writers SEMICON West 2002 New PH150 Probe Card Reduces Cost of Test and Capital Equipment...cards, today introduced the PH150(TM) probe card that enables testing of 300mm dynamic...fabrication facilities (fabs). The PH150 probe card incorporates FormFactor's scalable ...

Article: FormFactor Slashes Cost Of Test By 50 Percent with Four-Touchdown Probe Card.
Business Wire;  November 15, 2001 ;     641 words ......Calif.--(BUSINESS WIRE)--Nov. 15, 2001 Probe Card Capable of Testing 192 Devices in Parallel...FormFactor has shipped the world's first probe card capable of testing 192 synchronous DRAM...several years now, with each new FormFactor probe card raising the bar over the previous ones...

Article: SUSS MicroTec Introduces the IZI Probe(R) Card; the Only Repairable RF Probe Card with IZI Probe Technology.
Business Wire;  June 15, 2006 ;     472 words ......renowned IZI Probe(R) family, the IZI Probe Card. This new solution integrates the...IZI Probe technology into an RF probe card specifically designed for production...impossible, to repair. The IZI Probe Card from SUSS is the first RF probe...

Article: Cerprobe Announces Vertical Probe Card Strategy.
Business Wire;  July 14, 1998 ;     551 words ......multiple ICs simultaneously. Vertical probe card technology is expected to experience...designs. Cerprobe began its vertical probe card development in 1995 through a multi-year...the assembly and repair of the vertical probe card product of Upsys, a French testing and...

Article: JEM America and Teradyne Announce Development of 80-Device In-Parallel Probe Card for High-Parallel Probe Test Systems.
Business Wire;  September 13, 2000 ;     647 words ......Materials Corp. (JEM), a world leader in probe card manufacturing, have announced the...of an 80 device-under-test (DUT) probe card utilizing JEM's vertical-contact technology. This highly-parallel probe card supports Teradyne's ongoing development...

Article: FormFactor Unveils Harmony XP(TM) Wafer Probe Card, the Industry's First Two-Touchdown 300-mm DRAM Wafer Probe Solution.
Business Wire;  January 29, 2007 ;     700+ words ...New Probe Card Platform Designed to Address Advanced...with the introduction of its Harmony XP probe card--an advanced wafer probing solution for...overall test cost per die. The Harmony XP probe card is specifically designed to address the...

Article: FormFactor Unveils New Addition to Wire Bond Logic Probe Card Family to Lower IC Test Costs for Mobile and Consumer Applications.
Business Wire;  December 4, 2007 ;     700+ words ......latest addition to its TrueScale[TM] probe card family for wire bond system-on-chip...micron pad pitch, the TrueScale PP40 wafer probe card is designed to enable high-efficiency...microns, FormFactor's TrueScale PP40 probe card allows IC manufacturers to shrink the...