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Article: Uniphase Announces Automatic Defect Classification Product; Ultrapointe laser imaging defect review station offers automated defect classification product for semiconductor producers.
- Article from:
- Business Wire
- Article date:
- May 31, 1996
CopyrightCOPYRIGHT 1996 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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SAN JOSE, Calif.--(BUSINESS WIRE)--May 31, 1996-- Uniphase Corporation (NASDAQ:UNPH) today announced the release of a new automatic defect classification (ADC) software accessory product for its laser imaging defect review station. The company's laser imaging systems are used to analyze defects on wafers during the semiconductor manufacturing process. The ability to review defects using ADC is becoming increasingly important to semiconductor manufacturers as it facilitates defect classification without direct operator evaluation at each defect site. This automation can improve reliability and consistency by eliminating operator-induced variations. In addition, such ...