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Article: KLA-Tencor Extends its Online Automated Defect Classification Solution with Industry's First ADC Matching Software.
- Article from:
- Business Wire
- Article date:
- July 9, 1997
CopyrightCOPYRIGHT 1997 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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SAN JOSE, Calif.--(BUSINESS WIRE)--July 9, 1997--KLA-Tencor Corp. (NASDAQ:KLAC), today introduced the semiconductor industry's first matching capability for automated defect classification (ADC).
With this powerful new tool, integrated circuit (IC) manufacturers will be able to match automated defect classification schemes both within and between fabs to accelerate the ramp to higher process yields.
"ADC matching is one of the most requested extensions to the company's IMPACT/Online ADC system," said Scott Landstrom, vice president of defect review and analysis at KLA-Tencor. "Matching is especially critical for IC manufacturers needing to ...