Article: New lightwave technology study findings have been reported by scientists at National Taiwan University.

According to a study from Taipei, Taiwan, "A novel laser-reformation technique is presented for sidewall smoothing of silicon waveguides. A KrF excimer laser is used to melt and reform the sidewalls to reduce the surface roughness."

"Atomic-force-microscopy measurement shows that the root-mean-square (rms) roughness is reduced from 14 to 0.24 nm. The calculated scattering loss is reduced to 0.033 dB/cm. The waveguide profile after laser illumination at an incident angle of 75 degrees transforms to a shape of arch," wrote S.C. Hung and colleagues, National Taiwan University.

The researchers concluded: "The crystal quality of laser-illuminated silicon ...

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