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Article: New lightwave technology study findings have been reported by scientists at National Taiwan University.
- Article from:
- China Weekly News
- Article date:
- June 2, 2009
CopyrightCOPYRIGHT 2009 NewsRX. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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According to a study from Taipei, Taiwan, "A novel laser-reformation technique is presented for sidewall smoothing of silicon waveguides. A KrF excimer laser is used to melt and reform the sidewalls to reduce the surface roughness."
"Atomic-force-microscopy measurement shows that the root-mean-square (rms) roughness is reduced from 14 to 0.24 nm. The calculated scattering loss is reduced to 0.033 dB/cm. The waveguide profile after laser illumination at an incident angle of 75 degrees transforms to a shape of arch," wrote S.C. Hung and colleagues, National Taiwan University.
The researchers concluded: "The crystal quality of laser-illuminated silicon ...
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