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Article: United States : FormFactor Reaches Reliability Milestone With TakumiTM Parametric Probe Card.
- Article from:
- TendersInfo
- Article date:
- August 12, 2009
CopyrightCOPYRIGHT 2009 Al Bawaba (Middle East) Ltd. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Byline: pinto03
FormFactor, Inc. (NASDAQ: FORM) today announced it has reached a new reliability milestone for its Takumi wafer probe card -- an advanced probing solution used by IC manufacturers for end-of-line and in-line parametric testing. Several Takumi cards in production use for over two years at Elpida Memory, Inc. have performed between 15 and 16 million contact cycles (or touch downs) on silicon wafers, delivering product durability and reliability unmatched by traditional parametric probing technologies.
"The Takumi probing technology is remarkably reliable and stable," stated Masao Shimizu, Fab Process Group Engineer, Elpida Memory. "With ...
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