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Article: ADVANTEST'S NEW WAFER TEST OFFERS BEST 768 DEVICE TEST.

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Electro Manufacturing
Article date:
September 1, 2009
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Advantest Corporation has announced availability of its new T5385 memory test system for dynamic random access memory (DRAM) wafer test, offering a parallel test capability of 768 devices -- the highest in the industry, and twice the capability of the company's previous model. The T5385 will be available beginning August 2009.

Demands at wafer level test continue to increase for both improved performance and a lowered cost-of-test. Advantest's new T5385 addresses these issues and improves efficiency per device while scaling even higher in parallelism. The T5385 not only boasts an unrivaled 768-DUT parallel test capacity, but also delivers 533Mbps capability for ...

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