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Article: Allteq Industries Debuts New Open/Short Test System for BGA/Micro BGA-Packaged Devices.
- Article from:
- Business Wire
- Article date:
- June 4, 1998
CopyrightCOPYRIGHT 1998 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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FREMONT, Calif.--(BUSINESS WIRE)--June 4, 1998--Allteq Industries has introduced the Series 4000 open/short test system family for locating assembly-related electrical defects in semiconductors packaged in the BGA (ball grid array) and Micro BGA formats.
The L4000, a single test-head machine with programmable Z height control, is the first member of the series, and accommodates BGA and Micro BGA-packaged integrated circuits in strip form for fully automated testing.
Featuring a single magazine input/output, and a flying head index system, devices are presented to the L4000 test head at high speed. The L4000 will test any packaged device which is ...