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Article: Veeco Introduces NPFLEX 3D Metrology System.
- Article from:
- Business Wire
- Article date:
- September 21, 2009
CopyrightCOPYRIGHT 2009 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Rapid, Three-Dimensional Surface Characterization for Large Samples
PLAINVIEW, N.Y. -- Veeco Instruments Inc. (Nasdaq: VECO), a leader in scientific and industrial metrology, today announced the release of its NPFLEX[TM] 3D Metrology System for characterizing surfaces previously too difficult to measure due to size or part orientation. The NPFLEX combines the industry-leading performance of Veeco's non-contact, white light optical profilers with a unique open-access design to enable rapid, three-dimensional data acquisition and analysis on a wide range of large samples for precision machining applications in the medical implant, aerospace, and automotive market ...