|
|
Article: Research from Hanyang University reveals new findings on instrumentation research.
- Article from:
- Electronics Newsweekly
- Article date:
- October 14, 2009
CopyrightCOPYRIGHT 2009 NewsRX. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
|
According to recent research published in the journal IEEE Transactions on Instrumentation and Measurement, "Scan-based delay testing increases power consumption, particularly peak power, due to excessive simultaneous signal switching. The instantaneous current changes increase the ground level during signal switching, slowing down the operational speed."
"When the switching activity increases during test operations, it is necessary to pay special attention to determine whether the speed failures are due to extra switching, since the blind application of delay testing can greatly affect the yield of a device. This paper demonstrates that cycle time adjustment is ...