Article: New applied physics research from L. Zommer et al outlined.

"Special samples with multilayers which are perpendicular to the surface are presently proposed for testing the lateral resolution of surface imaging. Despite considerable progress in theoretical description of the electron transport phenomena in a solid, there is a need for theoretical depiction of the electron transport in samples of this kind," investigators in Warsaw, Poland report.

"An accurate description can be gained by Monte Carlo (MC) simulations of electron trajectories. We investigated the relation of the backscattering yield (BY) versus the beam position for selected systems with perpendicular layers filled with high, medium and low atomic numbers: ...

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