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Article: High-temperature testing exposes failure modes.
- Article from:
- EDN
- Article date:
- August 17, 1998
- Author:
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At 8:30 pm, instead of being home with the family, I was running a problematical motor drive at 100 [degrees] C ambient temperature. The engineering vice president, Buzz, came over to review my testing (and to assert his authority). He said I was foolish to run a 55 [degrees] C-rated motor drive at 100 [degrees] C because I would destroy the motor drive without gaining any constructive data.
This incident, like others discussed in my columns, happened long before I joined Harris Semiconductor; thus, I hadn't yet gathered concrete data to substantiate my position. I told Buzz that there was a problem with the motor drives, though they passed all the standard tests, ...