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Article: Nanometrics Lands Multi-System Integrated Metrology Order.
- Article from:
- Health & Beauty Close-Up
- Article date:
- November 5, 2009
CopyrightCOPYRIGHT 2009 Close-Up Media, Inc. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Nanometrics Inc., a supplier of process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, announced a multi-system order from a leading semiconductor foundry for its Integrated Metrology (IM) and NanoCD suite solutions.
The systems will be delivered in the fourth quarter of this year for optical critical dimension (OCD) metrology on 22nm gate etch applications.
"Nanometrics' IM systems and our industry leading NanoCD suite were chosen by a leading foundry partner to support advanced 22nm gate patterning process control," said Steve Bradley, Director of ...