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Article: Studies from B. Khong et al add new findings in the area of materials science.
- Article from:
- Journal of Technology
- Article date:
- November 10, 2009
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"The fatigue-induced modifications of the structure of power devices on components that underwent extreme electro-thermal fatigue were investigated, with special attention to the behaviour of the Al metallization layer," investigators in Toulouse, France report.
"Electrical cycling induced a moderate grain growth in the metallization layer, except for the regions located beneath the connection wires. There the wire bonding process is associated with severe plastic deformation, leading to a fragmentation of the initial grains and significant grain growth," wrote B. Khong and colleagues.
The researchers concluded: "Grain-boundary grooving is another ...