Article: Aeroflex launches complete solution for RF parametric test of wireless subsystems, including LTE; New 7000 Series combines vector signal generation and analysis in a single, fully integrated RF test system.

M2 PRESSWIRE-10 November 2009-Aeroflex: Aeroflex launches complete solution for RF parametric test of wireless subsystems, including LTE; New 7000 Series combines vector signal generation and analysis in a single, fully integrated RF test system(C)1994-2009 M2 COMMUNICATIONS

RDATE:10112009

Productronica, Munich, Germany -- Aeroflex announced today the launch of the 7000 Series Vector Analyzer Generator (VAG), a single, fully integrated RF parametric test system for RF test of wireless components and subsystems. The 7000 Series combines both vector signal generation and vector signal analysis in a single box, providing an integrated approach to ...

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