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Article: Nanometrics Introduces NanoSpec 9300 Automated 300 MM Film Metrology System; Advanced System for the Measurement of Next-Generation Materials and Processes.
- Article from:
- Business Wire
- Article date:
- June 27, 2000
CopyrightCOPYRIGHT 2000 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Business/High-Tech Editors
SEMICON West 2000 - Booth No. 1501
SUNNYVALE, Calif.--(BUSINESS WIRE)--June 27, 2000
Nanometrics, Inc. (Nasdaq:NANO), an industry leader in semiconductor metrology equipment, today unveiled the NanoSpec(R) 9300, an automated, non-contact thin film metrology system designed for use in advanced 300 mm high-volume semiconductor manufacturing. An extension of Nanometrics' widely accepted NanoSpec 9000 platform, the NanoSpec 9300 is the only high-end standalone film metrology system equipped to handle the advanced materials and processes now being introduced into IC manufacturing.
The NanoSpec 9300 features a ...