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AMD announces a major advancement in Flash memory test technology; Industry leading access speeds now available in Known Good Die (KGD) form.

M2 PRESSWIRE-27 February 2001-AMD: AMD announces a major advancement in Flash memory test technology; Industry leading access speeds now available in Known Good Die (KGD) form (C)1994-2001 M2 COMMUNICATIONS LTD

RDATE:26022001

SUNNYVALE, CA -- AMD today announced a major advancement in Flash memory test technology that allows the company to test bare die, Burst Mode Flash memory devices. This breakthrough enables AMD to guarantee high performance Flash memory in a smaller, space saving form factor that can operate at very high temperatures. Advanced automotive engine control units, network cards and handheld organizers are some of the applications that will ...

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