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AMD announces a major advancement in Flash memory test technology; Industry leading access speeds now available in Known Good Die (KGD) form.
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M2 Presswire
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February 27, 2001
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Copyright informationCOPYRIGHT 2001 M2 Communications Ltd. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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M2 PRESSWIRE-27 February 2001-AMD: AMD announces a major advancement in Flash memory test technology; Industry leading access speeds now available in Known Good Die (KGD) form (C)1994-2001 M2 COMMUNICATIONS LTD
RDATE:26022001
SUNNYVALE, CA -- AMD today announced a major advancement in Flash memory test technology that allows the company to test bare die, Burst Mode Flash memory devices. This breakthrough enables AMD to guarantee high performance Flash memory in a smaller, space saving form factor that can operate at very high temperatures. Advanced automotive engine control units, network cards and handheld organizers are some of the applications that will ...