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Article: Aehr Test Systems Introduces Full Wafer Contact Burn-In and Parallel Test System.
- Article from:
- PR Newswire
- Article date:
- July 13, 2001
CopyrightCOPYRIGHT 2001 PR Newswire Association LLC. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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FREMONT, Calif., July 13 /PRNewswire/ --
Aehr Test Systems (Nasdaq: AEHR), a leading provider of burn-in and parallel test solutions for DRAMs and other integrated circuits, announced today it will introduce its FOX(TM) Full Wafer Contact system during Semicon West 2001. The FOX system is designed to make contact with all pads of a wafer simultaneously, thus enabling full wafer burn-in and parallel test. The FOX system is applicable to a wide range of semiconductor wafers.
In June, Aehr Test Systems announced the first order for its FOX wafer-level burn-in contactor for laser diodes, which will be used in a wafer-level burn-in system. This represents ...