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Article: Link EMI to ESD events: Don't underestimate the effects of radiated EMI on today's logic circuits. (Special ESD Coverage - EMI Test).
- Article from:
- Test & Measurement World
- Article date:
- March 1, 2002
- Author:
CopyrightCOPYRIGHT 2002 Reed Business Information, Inc. (US). This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Although most engineers recognize the benefits of controlling static charges that can damage sensitive devices, there's an additional reason to implement a comprehensive control program for electrostatic discharge (ESD). ESD events can also produce electromagnetic interference (EMI). Because logic devices have small noise margins, they're increasingly sensitive to EMI, which can cause hardware failures.
The EMI radiated from an ESD event can couple into a system's cables or into an open chassis where it changes to a voltage or current spike that can corrupt the operation of logic circuits. The EMI proves difficult to trace to a source because it can come from an ...