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Article: Electron diffraction using transmission electron microscopy.
- Article from:
- Journal of Research of the National Institute of Standards and Technology
- Article date:
- November 1, 2001
- Author:
CopyrightCOPYRIGHT 2001 National Institute of Standards and Technology. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength ([approximately equal to]2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter ([approximately equal to]10 [nm.sup.3]). The NIST Materials Science and Engineering Laboratory has a history of discovery and characterization of new structures through electron diffraction, alone or in combination with other diffraction methods. This paper ...