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Article: Electroglas Advances Automated Defect Classification for Semiconductor Manufacturers.
- Article from:
- Business Wire
- Article date:
- July 9, 2002
CopyrightCOPYRIGHT 2002 Business Wire. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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Business Editors/High-Tech Writers
SEMICON West 2002
Electroglas DefectID(TM) Delivers Automatic Defect Classification
for Random Defects Over the Entire Wafer Surface, Building Upon
Capabilities in Electroglas' QuickSilver Inspection Systems
Electroglas, Inc. (Nasdaq:EGLS), a leading supplier of process management tools for the semiconductor industry, today introduced DefectID(TM), automatic defect classification software that helps improve manufacturing productivity and yields for wafer fabrication test, assembly and packaging operations. Working in conjunction with Electroglas' QuickSilver automated wafer inspection systems, ...