|
|
Article: Test socket lid. (New Products).
- Article from:
- Semiconductor International
- Article date:
- December 1, 2002
CopyrightCOPYRIGHT 2002 Reed Business Information. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
|
CAM lid for high-frequency test sockets helps eliminate damage to package pads. It provides precise Z-directional force with no X or Y movement. The load can he applied to the device after the socket is closed and latched. The lid can he used on any of the company's ...
Related newspaper, magazine, and journal articles:
|
|
Article: Japanese Inventors Develop Test Socket ...
US Fed News Service, Including US State News;
September 28, 2006 ;
525 words
... ... Yoshihiro Kashiba and Shigeru Takada, all from Tokyo, have developed a test socket, a method of manufacturing the test socket, and a test method using the test socket. According to the U.S. Patent & Trademark Office: "Two resilient ...
|
|