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Article: Nist researchers complete uncertainty analysis for linking ECCS to SI farad. (General Developments).(Electron-Counting Capacitance Standard)
- Article from:
- Journal of Research of the National Institute of Standards and Technology
- Article date:
- September 1, 2002
CopyrightCOPYRIGHT 2002 National Institute of Standards and Technology. This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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NIST researchers have completed an uncertainty analysis for the comparison of a cryogenic vacuum-gap capacitor against the NIST calculable capacitor. This work is a critical step in the development of the Electron-Counting Capacitance Standard (ECCS).
The essential idea of the ECCS is to place an accurately known electric charge, by counting individually each of about [10.sup.8] electrons, onto the plate of a cryogenic vacuum-gap capacitor and then to measure the charging voltage with high accuracy. The capacitance of the device is determined directly from the charge-to-voltage ratio. Three valuable uses have been identified for the ECCS. It will serve as a ...
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Article: Unisys and ECCS enter OEM agreement for ECCS' New ...
Business Wire;
March 25, 1996 ;
700+ words
... ... J.--(BUSINESS WIRE)--March 25, 1996--ECCS Inc. (NASDAQ: ECCS) and Unisys Corp. announced that they have signed ... Unisys with the rights to market a customized version of ECCS' Synchronix Storage Management System, named ASR9000 ...
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