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Article: Partition IEEE 1149.1 SCAN chains for manageability! (Advertisement).(National Semiconductor's SCANSTA111 multiplexer)(Advertising)
- Article from:
- EDN
- Article date:
- December 26, 2002
- Author:
CopyrightCOPYRIGHT 2002 Reed Business Information, Inc. (US). This material is published under license from the publisher through the Gale Group, Farmington Hills, Michigan. All inquiries regarding rights should be directed to the Gale Group. (Hide copyright information)
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The proliferation of IEEE 1149.1 supported devices is helping Design for Test (DfT) engineers solve complex test access problems during board test. As ICs become more complex and boards become denser, this dedicated 5-wire serial test bus provides simple, standardized access to internal test nodes unreachable with existing In-Circuit-Test (ICT) methods. Many new board designs are incorporating JTAG as a standard feature for test and programming access--in many cases there is simply no other methodology capable of achieving an acceptable level of board fault coverage, or a cost effective means of programming on-board.
If you're investigating this technology for ...