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Article: Hamamatsu Utilizes Teseda Platforms for Failure Analysis Systems

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Wireless News
Article date:
October 26, 2007
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Wireless News
10-26-2007
Hamamatsu Utilizes Teseda Platforms for Failure Analysis Systems

WIRELESS NEWS-October 26, 2007-Hamamatsu Utilizes Teseda Platforms for Failure Analysis Systems (C)2007 10Meters - http:// www.10meters.com

Teseda Corp., a provider of comprehensive scan-based diagnostic and debug solutions for semiconductor yield improvement, announced that Hamamatsu Photonics K.K. will adopt its V-series hardware DFT test platforms as an option in their Semiconductor Device Failure Analysis systems.
Inter Action Corp., Teseda's manufacturing partner and leading distributor of Teseda products for Japan and Asia, will work with Hamamatsu to provide the platforms.

"The V-Series DFT ...

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