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Article: Nanometrics Gets Multi-System Integrated Metrology Order from Leading Foundry
- Article from:
- Wireless News
- Article date:
- November 9, 2009
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Wireless News
11-09-2009
Nanometrics Gets Multi-System Integrated Metrology Order from Leading Foundry
Type: News
Nanometrics Inc., a supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, announced a multi-system order from a leading semiconductor foundry for its Integrated Metrology (IM) and NanoCD suite solutions.
The systems will be delivered in the fourth quarter of this year for optical critical dimension (OCD) metrology on 22nm gate etch applications.
"Nanometrics' IM systems and our industry leading NanoCD suite were chosen by a leading foundry partner to support ...