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Article: Idaho Inventor Develops Probe Card Damage Preventing Apparatus
- Article from:
- US Fed News Service, Including US State News
- Article date:
- October 6, 2006
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ALEXANDRIA, Va., Oct. 6 -- Phillip E. Byrd of Boise, Idaho, has developed an apparatus to prevent damage to probe card.
According to the U.S. Patent & Trademark Office: "Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card."
An abstract of the invention, released by the Patent Office, said: "The fuses may be active or passive fuses and are preferably self-resetting, repairable, and/or replaceable. Typically, the fuses will be interposed in, or located ...