|
|
Article: California Inventors Develop Vertical Probe Card
- Article from:
- US Fed News Service, Including US State News
- Article date:
- October 25, 2006
CopyrightCopyright © HT Media Ltd. All Rights Reserved. Provided by ProQuest LLC. (Hide copyright information)
|
ALEXANDRIA, Va., Oct. 25 -- Michael L.Anderson of San Jose, Calif., Edward A. McCloud of Castro Valley, Calif., Shahriar Mostarshed of San Mateo, Calif., and Michael A. Casolo of Oakland, Calif., have developed a vertical probe card for mounting generally perpendicular to a heated planar device that undergoes test to reduce heat transfer to the probe card during test.
According to the U.S. Patent & Trademark Office: "A probe card is vertically mounted generally perpendicular to a wafer undergoing life tests in a heated environment to limit exposure of the probe card to heat from the wafer chuck. The probe card and probe head assembly are mounted on a support rail which has one or more ...