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Article: Idaho Inventor Develops Probe Card Damage Prevention Method

Article from:
US Fed News Service, Including US State News
Article date:
May 24, 2007
Copyright

ALEXANDRIA, Va., May 24 -- Phillip E. Byrd of Boise, Idaho, have developed a method to prevent damage to probe card.

According to the U.S. Patent & Trademark Office: "Probe cards are configured with protective circuitry suitable for use in electrical testing of semiconductor dice without damage to the probe cards. Protective fuses are provided in electrical communication with conductive traces and probe elements (e.g., probe needles) of a probe card. The fuses may be active or passive fuses and are preferably self-resetting, repairable, and/or replaceable. Typically, the fuses will be interposed in, or located adjacent to, conductive traces residing over a surface of the probe card. ...

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