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Article: INTERNATIONAL TRADE COMMISSION INSTITUTES SECTION 337 INVESTIGATION ON CERTAIN PROBE CARD ASSEMBLIES, COMPONENTS THEREOF, CERTAIN TESTED DRAM, NAND FLASH MEMORY DEVICES, PRODUCTS CONTAINING SAME
- Article from:
- US Fed News Service, Including US State News
- Article date:
- December 13, 2007
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The U.S. International Trade Commission issued the following press release:
The U.S. International Trade Commission (ITC) has voted to institute an investigation of certain probe card assemblies, components thereof and certain tested DRAM and NAND flash memory devices and products containing same. The products at issue in this investigation are probe card assemblies, which are used to test semiconductor devices that have been fabricated on silicon wafers, memory chips that have been so tested, and products containing such chips.
The investigation is based on a complaint filed by FormFactor, Inc., of Livermore, CA, on November 13, 2007, as amended on December 7, 2007. The amended complaint ...
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