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Article: U.S., Canadian Inventors Develop Integrated Circuit Testing Probe Card
- Article from:
- US Fed News Service, Including US State News
- Article date:
- December 24, 2007
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ALEXANDRIA, Va., Dec. 24 -- Richard A. Larder and Makarand S. Shinde, both of Livermore, Calif., Benjamin N. Eldridge of Danville, Calif., Gary W. Grube of Pleasanton, Calif., Ken S. Matsubayashi of Fremont, Calif., and Gaetan L. Mathieu of Varennes, Canada, have developed an integrated circuit testing probe card.
According to the U.S. Patent & Trademark Office: "A method and system for compensating for thermally induced motion of probe cards used in testing die on a wafer are disclosed. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed."An abstract of the invention, released by the Patent ...