|
|
Article: Japanese Inventors Develop Secondary Cells Critical State Estimation System
- Article from:
- US Fed News Service, Including US State News
- Article date:
- May 6, 2008
CopyrightCopyright © HT Media Ltd. All Rights Reserved. Provided by ProQuest LLC. (Hide copyright information)
|
ALEXANDRIA, Va., May 6 -- Daijiro Yumoto of Zama, Japan, and Hideo Nakamura of Yokohama, Japan, have developed a critical state estimation method.
According to the U.S. Patent & Trademark Office: "For estimation of a critical state of a performance under a working condition of a secondary cell, in consideration of an internal resistance of the cell, a variable data provider provides variable data on the performance, including a first data on a variant of the performance, a second data on a current of the cell, and an estimated third data on a dynamic characteristic of the internal resistance, a specified data provider provides specified data on the cell, including a fourth data on a ...