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Article: Illinois Inventor Develops Thin Film Calorimeter
- Article from:
- US Fed News Service, Including US State News
- Article date:
- September 26, 2008
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ALEXANDRIA, Va., Sept. 26 -- Stephen B. Siegel of Chicago has developed a method for measuring a factor of ultraviolet curability.
According to the abstract released by the U.S. Patent & Trademark Office: "A thin film calorimeter test station can be coupled to a controller in a thin film calorimeter. The thin film calorimeter can comprise a base substrate, a heat flux sensing device mounted on the base substrate, a mask having a hole with a predetermined area positionable above the heat flux sensing device, and a thickness control device for establishing a repeatable precise thickness layer of ultravoilet (UV) curable sample test material between the mask and the heat flux sensing ...