Article: Illinois Inventor Develops Thin Film Calorimeter

ALEXANDRIA, Va., Sept. 26 -- Stephen B. Siegel of Chicago has developed a method for measuring a factor of ultraviolet curability.

According to the abstract released by the U.S. Patent & Trademark Office: "A thin film calorimeter test station can be coupled to a controller in a thin film calorimeter. The thin film calorimeter can comprise a base substrate, a heat flux sensing device mounted on the base substrate, a mask having a hole with a predetermined area positionable above the heat flux sensing device, and a thickness control device for establishing a repeatable precise thickness layer of ultravoilet (UV) curable sample test material between the mask and the heat flux sensing ...

Related newspaper, magazine, and journal articles:

 
 
Newsweek Harper's Magazine The Washington Post Chicago Tribune Crain's Chicago Business PRNewswire Pediatric News The Nation Advertising Age The Economist (US) A FREE trial gives you access to over 80 million articles! Access over 6,500 publications with a FREE trial!